Pulsed laser Tests of Single Event Effects in the typical analog circuits were proposed. The Single Event Transient(SET) test evaluation method characteristics and the response thresholds of operational amplifiers at 79.4 pJ and 115.4 pJ were investigated with the experimental simulation by pulsed laser test facility. The influence of SET on subsequent digital circuits and power supply module system were qualitatively analyzed. According to the hazard of SET effect on circuit system, reasonable filter circuits were completed. The system level hardening by the related fault injection experiments were established which had good radiation hardening effects.