With the development of satellite based remote sensors, embedded systems become more and more popular in space camera electronics. Static Random Access Memory(SRAM) is one kind of the most widely used memories due to its merits of high efficiency and low power dissipation, but testing its function still depends on writing testing modules with hardware description language, which results in low developing efficiency and low reliability. In this paper, an embedded testing method is proposed, which is based on MicroBlaze and its speed increasing function design. Implementation of the test method is based on reusable Intellectual Property(IP) technique and greatly improves data transfer speed. With this method, secondary development of SRAM test system can be made in application layer instead of fundamental logical layer, which simplifies the system design. It is not only more efficient and more reliable, but also easier to transplant, which greatly reduces test design cost. The validity and feasibility of the method have been proved by test results.