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有源器件端口反射系数测量方法分析
Analysis on the reflection coefficient measurement of the active device
投稿时间:2014-03-19  修订日期:2014-04-24
中文关键词:有源器件  反射系数测量  阻抗调配器  网络分析仪
英文关键词:active device  reflection coefficient measurement  impedance tuner  network analyzer
基金项目:科工局技术基础基金资助项目
作者单位
张翠翠 Metrology and Testing CenterChina Academy of Engineering PhysicsMianyang Sichuan 621999China 
王 益 Metrology and Testing CenterChina Academy of Engineering PhysicsMianyang Sichuan 621999China 
王建忠 Metrology and Testing CenterChina Academy of Engineering PhysicsMianyang Sichuan 621999China 
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中文摘要:
      有源器件的端口反射系数是器件的主要参数,端口反射系数的大小直接影响信号的输出功率。为实现有源器件在“射频开”状态下端口反射系数的测量,开展了阻抗调谐器法和网络分析仪频率偏移法的源端口反射系数测量方法研究,并针对信号源和放大器开展了相应的实验。测量结果表明,10 dBm输出时2种方法测得反射系数模值的差别小于0.06,相位变化差别优于10°,为有源器件端口反射系数的测量提供了可行的方法。
英文摘要:
      Reflection coefficient of the active device is the main parameter which directly affects the output power of the signal. The two methods-impedance tuner and Vector Network Analyzer(VNA) frequency shift , are analyzed in order to measure the reflection coefficient of active device on the state of "RF ON". Some measurement experiments on the signal generator and amplifier are performed. The results show that, the difference between the two methods is less than 0.06,and the phase difference is below 10°, under 10 dBm of the output. The work provides feasible ways to measure the reflection coefficient of active devices.
引用本文:张翠翠,王 益,王建忠.有源器件端口反射系数测量方法分析[J].太赫兹科学与电子信息学报,2015,13(2):267~271
DOI:10.11805/TKYDA201502.0267
学科分类代码:
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