Analysis of Latch-up Single Window and Multi-window Phenomena in CMOS Devices
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Abstract:
When CMOS devices are irradiated by transient radiation, phenomena of latch-up single window or multi-window may appear. To find the cause of latch-up window phenomena many references concerned in detail are studied and the reciprocity of several paths in
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许献国,杨怀民,胡建栋.对辐射感应闭锁窗口现象的解释[J]. Journal of Terahertz Science and Electronic Information Technology ,2004,2(4):